Electronic characterisation technical platform

The ModuLab XM PhotoEchem System, composed of an optical bench and an electrical measurement system allows to perform a range of different measurements on solar cells or photoelectrochemical cells.

These different measurements are :

- Impedance spectroscopy (in the dark and under illumination) (IS)

- Intensity-modulated photocurrent/photovoltage spectroscopy (IMPS/IMVS)

- Open circuit voltage decay measurements (OCVD)

- Charge extraction measurements (CE)

- I-V analysis in the dark and under illumination (LED or Solar simulator)

- Incident Photon to Current conversion Efficiency (IPCE) measurements


 

But also the ModuLab XM PhotoEchem utilizes the ModuLab Frequency Response Analyzer and Potentiostat technology. The standard techniques are:

-Cyclic Voltammetry (Staircase and Linear Sweep)

-Potentiostatic Steps

-Normal and Differential Pulse Techniques

-Potentiostatic and Galvanostatic Impedance (Single Sine or Multi-Sine FFT)

-AC Voltammetry


 

This system linked with the HAL-320 solar simulator constitutes an electro-optical characterization bench and the ability to control the optical bench for all of these standard techniques allows to develop more diagnostic techniques for solar cells.

 

 

Campus  :  Beaulieu
Room: 258
Build: 10 B

In charge : Michel Cathelinaud

 optical bench and an electrical measurement system