Three AFM microscopes are available in our SPM Center :
- NT-MDT Ntegra (Topography, Electric and Piezoelectric measurements)
- Asylum Research Cypher, dedicated to Dip-Pen development
- Agilent PicoSPM, dedicated to development in electrochemical and thermal AFM
Optical microscope equipped with a cross polariser, a heating plate 9-180 to 420 °C and optical fiber for UV irradiation of the sample.
Bruker Dektak XT profilometer providing steps and roughness measurements.