Transmission Electron Microscopy (TEM)
Transmission Electron Microscopy (TEM) is a very powerful technique to characterize materials at a very small scale up to the interatomic distance.
TEM needs very thin sample as the electrons have to pass through the sample to be collected. As a result, massive samples like ceramics have to be thinned by mechanical polishing and ion milliing. Defaults like grain bondary, dislocation, porosity, vacancy, twinning etc… can then be observed directly.
TEM can also performed Electron Diffraction to exhibit weak intensity reflections linked order like oxygen vacancy ordering or octahedra tilting in perovsike-like structure.
Combine with associated equipment as a scanning module an EDS (Energy Dispersive Spectroscoy) detector and a imaging filter, TEM allows elemental mappings and elemental quantification of the samples.
The equipments for TEM are located at the platform THEMIS of the UMS2001 ScanMAT